Products
Explore the Lumos product lineup for different inspection goals and process conditions.
LUM-B Series
A versatile RAW laser beam profiler for industrial and research applications. It supports a wide range of lasers (UV to IR) with selectable models based on wavelength and sensor configurations.
LUM-B-L Series
A large-area sensor-based beam profiler designed for large-diameter beam measurements. It is ideal for verifying the quality of expansive beams, including expanded beams, flat-top beams, and pre-scanning beams.
LUM-F Series
A micro spot measurement beam profiler featuring an all-in-one integrated design that covers the UV to IR spectrum.
LUM-Z Series
A precision 3D beam profiling and analysis system designed for detailed spot size and depth-of-focus evaluation, supported by intuitive 2D and 3D profile viewers.
Software
Details are currently being finalized.